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      考慮尺度效應具損傷微板的坍塌特性分析

      2020-04-17 08:54袁集海張祥敏陳昌萍
      湖南大學學報·自然科學版 2020年2期

      袁集海 張祥敏 陳昌萍

      摘? ?要:基于Kirchhoff板理論和修正偶應力理論,研究具損傷彈性微板的坍塌特性,推導了微板的動力學方程并采用伽遼金法進行求解,分析了損傷變量、特征尺度參數、微板與固定電極之間的距離和邊緣場對坍塌電壓的影響. 為了驗證模型的合理性,將本文所得結果與文獻結果進行了對比. 數值結果表明:結構損傷會減小坍塌電壓;而尺度效應會增大坍塌電壓;微板與固定電極之間的距離越大,坍塌電壓也越大;邊緣場的存在對坍塌電壓有微弱的影響. 本文所得結論對微機電系統(tǒng)微板結構的設計和應用提供一定的理論指導.

      關鍵詞:微機電系統(tǒng);微板;坍塌;尺度效應;損傷效應

      中圖分類號:O345? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ?文獻標志碼:A

      Abstract:Based on the Kirchhoff plate theory and the modified couple stress theory (MCST),this work focuses on the pull-in phenomena of elastic micro-plates with damage. The dynamic governing equation of the micro-plate was derived and then solved via Galerkin method. The effect of damage variable,length scale parameter,initial gap and fringing filed on pull-in voltage of the micro-plate was discussed in detail. Moreover,the reliability of present model was validated by comparing results obtained in this study and the literatures. Numerical results show that damage effect decreases pull-in voltage while size effect increases it; large initial gap results in large pull-in voltage and fringing field has slight influence on it. This research is helpful and useful in electrostatically actuated microstructures applications and provides a theoretical foundation for designers and engineers.

      Key words:Micro Electro Mechanical System(MEMS);micro-plate;pull-in;size effect;damage effect

      微機電系統(tǒng)(MEMS)因其優(yōu)越的性能而被廣泛應用于通訊、航空航天、生物醫(yī)學等領域. 微板結構是MEMS中主要的結構之一,其主要應用于微泵、微鏡和微麥克風等. 然而,MEMS微板尺寸微小,在工作的過程中抵抗外界因素如:溫度[1]、濕度[2]和微結構之間的微觀力[3-4]影響的能力較差,微板結構會與固定極板發(fā)生吸合現象,簡稱坍塌(Pull-in)[5]. 近年來國內外學者對微結構的坍塌現象進行了研究并取得了一定的成果. 陳昌萍等[6]研究了壓電層合微梁的靜力坍塌特性,并分析了控制電壓對坍塌電壓的影響. Sadeghian等[7]采用微分求積法和伽遼金法對夾支梁的坍塌不穩(wěn)定性進行了分析和對比. 考慮幾何非線性,Ghayesh等[8]和Farokhi等[9]研究了靜力驅動微板結構微機電系統(tǒng)的坍塌特性和非線性動力特性. 基于修正偶應力理論,Kazemi等[10]研究了層合壓電微板的非線性坍塌不穩(wěn)定性.

      以上研究主要基于經典彈性理論,研究表明微結構具有尺度效應[11].另外,MEMS器件在惡劣的環(huán)境下工作也會出現結構損傷,而目前以具損傷微板結構為對象的研究成果很少見. 本文以具損傷彈性微板為研究對象,討論了尺度效應、邊緣場效應等因素對微板坍塌電壓的影響.

      表2給出了邊緣場效應對坍塌電壓的影響. 由表2可以看出,考慮邊緣場效應時的坍塌電壓比不考慮邊緣場效應時的坍塌電壓略小. 從電場力的表達式(式(20))可知,邊緣場效應會提供微結構額外的電場力作用,因此考慮邊緣場效應時的坍塌電壓會略微減小.

      3? ?結? 論

      本文通過數值計算對夾支微板在電場力作用下坍塌特性進行分析,并將所得結果與文獻結果進行了對比,驗證了本文模型的合理性,討論了損傷效應、尺度效應、邊緣場效應以及初始間距對微板坍塌電壓的影響. 研究結果表明,損傷效應會減小坍塌電壓,而尺度效應會增大坍塌電壓,坍塌電壓會隨著初始間距的增大而大幅增加,考慮邊緣效應時坍塌電壓會稍微減小但變化不大. 本文所得結果對電致驅動微板結構設計具有一定的指導意義.

      參考文獻

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      HU H,DONG J X,LIU Y F. Temperature and preload voltage effect on nonlinearity of MEMS accelerometer[J]. Journal of Chinese Inertial Technology,2009,17(4):464— 468. (In Chinese)

      [2]? ? 唐潔影,陳龍龍,宋競. 振動作用對MEMS微結構濕汽吸附的影響[J]. 納米技術與精密工程,2009,7(2):173—177.

      TANG J Y,CHEN L L,SONG J. Effect of vibration on moisture-absorption of MEMS micro-structure[J]. Nanotechnology and Precising Engineering,2009,7(2):173—177. (In Chinese)

      [3]? ? LI G H,LABORIANTE I,LIU F,et al. Measurement of adhesion forces between polycrystalline silicon surface via a MEMS double-clamped beam test structure[J]. Journal of Micromechanics and Microengineering,2010,20(9):95015—95023.

      [4]? ? LUI H,GAO S,NIU S,et al. Analysis on the adhesion of micro-comb structure in MEMS[J]. International Journal of Applied Electromagnetics and Mechanics,2010,33(3):979—984.

      [5]? ? ZHANG J,FU Y M. Active control of the nonlinear static and dynamic responses for piezoelectric viscoelastic micro-plates[J]. Smart Material and Structure,2009,18(9):095037.

      [6]? ? 陳昌萍,李良中,胡海濤,等. 具損傷壓電層合微梁的坍塌特性研究[J]. 湖南大學學報(自然科學版),2016,43(8):57—62.

      CHEN C P,LI L Z,HU H T,et al. Study on the pull-in characteristics of piezoelectric laminated micro-beam with damage[J]. Journal of Hunan University(Natural Sciences),2016,43(8):57—62.(In Chinese)

      [7]? ? SADEGHIAN H,REZAZADEH G.Comparison of generalized differential quadrature and Galerkin methods for the analysis of micro-electro- mechanical coupled systems[J]. Communications in Nonlinear Science and Numerical Simulation,2009,14(6):2807—2816.

      [8]? ?GHAYESH M H,FAROKHI H. Nonlinear behaviour of electrically actuated microplate-based MEMS resonators[J]. Mechanical Systems and Signal Processing,2018,109:220—234.

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      [10]? KAZEMI A,VATANKHAH R,FARID M. Nonlinear pull-in instability of microplates with piezoelectric layers using modified couple stress theory[J]. International Journal of Mechanical Sciences,2017,130:90—98.

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      [13] LEMAITRE J A. Course on damage mechanics[M]. Berlin:Springer—Verlag,1992:1—210.

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